The 0.1 µm APC is MicronView's latest ultra-sensitive particle counter for detecting submicron contamination in ultraclean environments. It extends conventional monitoring capability down to 0.1 µm, making it essential for semiconductor and advanced pharmaceutical applications where nanoscale contamination drives yield loss.
Key Points:
- Detection down to 0.1 µm - ultra-sensitive for ISO Class 1–3 environments
- Designed for semiconductor fabrication plants and advanced cleanrooms
- Real-time data and trending for contamination root cause analysis
- Multiple flow rates available - 10LPM & 28.3 LPM
- Network-ready: RJ45, USB connectivity
- Compact form factor for flexible deployment
